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Compact NIR/SWIR InGaAs camera — Xenics XS (900 to 1700 nm or 400 to 1700nm)

The XS camera uses an uncooled NIR/ SWIR InGaAs FPA sensor, developed by Xenics, for imaging in the 900 to 1700 nm wavelength range (optionally 400 to 1700 nm).This infrared camera allows for exposure times from 1 µs to more than 100 ms, to give optimum image quality under varying conditions. The light-weight and very compact XS camera comes with USB2.0 communication as standard and exhibits a very low power consumption.Applications - laser beam profiling at 13xx and 15xx nm, surveillance, seeing through smoke, dust, haze, thermal imaging for high temperatures (>150°C), semiconductor inspection, seeing through silicon, laser range gated imaging at 15xx nm, imaging of designation and range finding lasers, camouflage detection, wavefront sensing for adaptive optics, hyperspectral SWIR imaging, etc.

Xenics XS-1.7-320 Scientific brochure (0,7 MB)
Silicon photonic integrated circuits imaging

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