The SWIR camera FAST S1k (Exosens / Telops) is built for industrial machine vision, scientific research, and process monitoring in the 0.9 – 1.7 µm band. Its 640 x 512 pixels InGaAs (20 µm pitch) supports up to 1000 Hz (Full) / up to 103 000 Hz (Subwindow). Typical applications include SWIR imaging, semiconductor inspection, and laser beam analysis.
Labs and production teams use this SWIR camera when they need stable 0.9 – 1.7 µm imaging for inspection or research.
Overview: High-speed, VGA-format SWIR system optimized for the collection of high-fidelity radiometric imagery of rapidly evolving, high temperature thermal targets at the highest temporal resolution.
Technical Specifications
| Manufacturer | Exosens (Legacy Telops) |
|---|---|
| Detector Type | InGaAs |
| Resolution | 640 x 512 pixels |
| Spectral Range | 0.9 – 1.7 µm |
| Pixel Pitch | 20 µm |
| Max Frame Rate | 1000 Hz (Full) / up to 103 000 Hz (Subwindow) |
| Sensitivity / Noise | <250 e- (high gain) |